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“MEMS length and strain measurements using an optical interferometer” Metadata:

  • Title: ➤  MEMS length and strain measurements using an optical interferometer
  • Author:

“MEMS length and strain measurements using an optical interferometer” Subjects and Themes:

Edition Identifiers:

  • The Open Library ID: OL3129786W

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Source: The Open Library

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Some editions of this work of literature - the Open Library.

1MEMS length and strain measurements using an optical interferometer

“MEMS length and strain measurements using an optical interferometer” Metadata:

  • Title: ➤  MEMS length and strain measurements using an optical interferometer
  • Language: English
  • Number of Pages: 81
  • Publisher: ➤  U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
  • Publish Date:
  • Publish Location: Gaithersburg, MD

“MEMS length and strain measurements using an optical interferometer” Subjects and Themes:

Edition Specifications:

  • Format: Microform
  • Pagination: vi, 81 p.

Edition Identifiers:

  • The Open Library ID: OL13630510M - OL3129786W
  • Online Computer Library Center (OCLC) ID: 50255496

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2MEMS length and strain measurements using an optical interferometer

“MEMS length and strain measurements using an optical interferometer” Metadata:

  • Title: ➤  MEMS length and strain measurements using an optical interferometer
  • Language: English
  • Number of Pages: 81
  • Publisher: ➤  U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
  • Publish Date:
  • Publish Location: Gaithersburg, MD

“MEMS length and strain measurements using an optical interferometer” Subjects and Themes:

Edition Specifications:

  • Format: Microform
  • Pagination: vi, 81 p.

Edition Identifiers:

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3MEMS length and strain measurements using an optical interferometer

“MEMS length and strain measurements using an optical interferometer” Metadata:

  • Title: ➤  MEMS length and strain measurements using an optical interferometer
  • Language: English
  • Number of Pages: 81
  • Publisher: ➤  U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
  • Publish Date:
  • Publish Location: Gaithersburg, MD

“MEMS length and strain measurements using an optical interferometer” Subjects and Themes:

Edition Specifications:

  • Format: Microform
  • Pagination: vi, 81 p.

Edition Identifiers:

  • The Open Library ID: OL17605854M - OL3129786W
  • Online Computer Library Center (OCLC) ID: 50255496

Online Marketplaces

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