Measurement Technology for Micro-Nanometer Devices - Info and Reading Options
By Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li and Chenyang Xue
"Measurement Technology for Micro-Nanometer Devices" is published by Wiley in Jan 17, 2017 and it has 352 pages.
“Measurement Technology for Micro-Nanometer Devices” Metadata:
- Title: ➤ Measurement Technology for Micro-Nanometer Devices
- Authors: ➤ Wendong ZhangXiujian ChouTielin ShiZongmin MaHaifei BaoJingdong ChenLiguo ChenDachao LiChenyang Xue
- Number of Pages: 352
- Publisher: Wiley
- Publish Date: Jan 17, 2017
“Measurement Technology for Micro-Nanometer Devices” Subjects and Themes:
- Subjects: ➤ Physical measurements - Measurement - Nanotechnology - Testing - Microtechnology - Microelectromechanical devices - Microscopy, technique - Microelectromechanical systems
Edition Specifications:
- Format: hardcover
Edition Identifiers:
- The Open Library ID: OL27712593M - OL20482367W
- Library of Congress Control Number (LCCN): 2015026167 - 2015032319
- ISBN-13: 9781118717967
- ISBN-10: 1118717961
- All ISBNs: 1118717961 - 9781118717967
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