Journey to data quality - Info and Reading Options
By Yang W. Lee
"Journey to data quality" was published by MIT Press in 2006 - Cambridge, Mass, it has 226 pages and the language of the book is English.
“Journey to data quality” Metadata:
- Title: Journey to data quality
- Author: Yang W. Lee
- Language: English
- Number of Pages: 226
- Publisher: MIT Press
- Publish Date: 2006
- Publish Location: Cambridge, Mass
“Journey to data quality” Subjects and Themes:
- Subjects: ➤ Informatique - Management - Gestion - Business - Database management - Qualité - Qualität - Quality control - Contrôle - Data processing - Unternehmen - Datenstruktur - Bases de données - Business, data processing - Industrial management
Edition Specifications:
- Pagination: xii, 226 p. :
Edition Identifiers:
- The Open Library ID: OL17243003M - OL17832861W
- Online Computer Library Center (OCLC) ID: 64596020
- Library of Congress Control Number (LCCN): 2006043331
- ISBN-13: 9780262122870
- ISBN-10: 0262122871
- All ISBNs: 0262122871 - 9780262122870
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