Statistical Metrology, 1998 3rd Workshop
By International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii), IEEE Electron Devices Society and Institute of Electrical and Electronics Engineers
"Statistical Metrology, 1998 3rd Workshop" is published by Institute of Electrical & Electronics Enginee in July 1998, it has 121 pages and the language of the book is English.
“Statistical Metrology, 1998 3rd Workshop” Metadata:
- Title: ➤ Statistical Metrology, 1998 3rd Workshop
- Authors: ➤ International Workshop on Statistical Metrology (3rd 1998 Honolulu, Hawaii)IEEE Electron Devices SocietyInstitute of Electrical and Electronics Engineers
- Language: English
- Number of Pages: 121
- Publisher: ➤ Institute of Electrical & Electronics Enginee
- Publish Date: July 1998
“Statistical Metrology, 1998 3rd Workshop” Subjects and Themes:
- Subjects: ➤ Semiconductors - Congresses - Statistical methods - Characterization - Measurement - Engineering measurement & calibration - Mathematics for scientists & engineers - Technology & Industrial Arts - Engineering Statistics - Very-Large-Scale Integration (Vlsi) - Technology - Science/Mathematics - Electronics - Semiconductors - Mensuration - Reference
Edition Specifications:
- Format: Paperback
- Weight: 10.4 ounces
- Dimensions: 11 x 8.8 x 0.5 inches
Edition Identifiers:
- The Open Library ID: OL8083152M - OL2776376W
- ISBN-13: 9780780343382
- ISBN-10: 0780343387
- All ISBNs: 0780343387 - 9780780343382
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