"Instrumentation, metrology, and standards for nanomanufacturing IV" - Information and Links:

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2-4 August 2010, San Diego, California, United States

"Instrumentation, metrology, and standards for nanomanufacturing IV" was published by SPIE in 2010 - Bellingham, Wash and the language of the book is English.


“Instrumentation, metrology, and standards for nanomanufacturing IV” Metadata:

  • Title: ➤  Instrumentation, metrology, and standards for nanomanufacturing IV
  • Author:
  • Language: English
  • Publisher: SPIE
  • Publish Date:
  • Publish Location: Bellingham, Wash

“Instrumentation, metrology, and standards for nanomanufacturing IV” Subjects and Themes:

Edition Specifications:

  • Pagination: 1 v. (various pagings) :

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