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3-5 August 2009, San Diego, California, United States

"Instrumentation, metrology, and standards for nanomanufacturing III" was published by SPIE in 2009 - Bellingham, Wash and the language of the book is English.


“Instrumentation, metrology, and standards for nanomanufacturing III” Metadata:

  • Title: ➤  Instrumentation, metrology, and standards for nanomanufacturing III
  • Author:
  • Language: English
  • Publisher: SPIE
  • Publish Date:
  • Publish Location: Bellingham, Wash

“Instrumentation, metrology, and standards for nanomanufacturing III” Subjects and Themes:

Edition Specifications:

  • Pagination: 1 v. (various pagings) :

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