Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII - Info and Reading Options
28 August, San Diego, California, United States
By Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (Conference) (7th 2013 San Diego, Calif.)
"Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII" was published by SPIE in 2013 - Bellingham, Washington, USA, it has 1 pages and the language of the book is English.
“Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII” Metadata:
- Title: ➤ Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
- Author: ➤ Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors (Conference) (7th 2013 San Diego, Calif.)
- Language: English
- Number of Pages: 1
- Publisher: SPIE
- Publish Date: 2013
- Publish Location: Bellingham, Washington, USA
“Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII” Subjects and Themes:
- Subjects: Nanostructured materials - Microfabrication - Congresses - Nanotechnology - Conference papers and proceedings
Edition Specifications:
- Pagination: 1 volume (various pagings)
Edition Identifiers:
- The Open Library ID: OL30404364M - OL22324396W
- Library of Congress Control Number (LCCN): 2015304450
- ISBN-13: 9780819496690
- ISBN-10: 0819496693
- All ISBNs: 0819496693 - 9780819496690
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