Infrared Characterization for Microelectronics - Info and Reading Options
By W. S. Lau
"Infrared Characterization for Microelectronics" was published by World Scientific Publishing Company in September 1999, it has 160 pages and the language of the book is English.
“Infrared Characterization for Microelectronics” Metadata:
- Title: ➤ Infrared Characterization for Microelectronics
- Author: W. S. Lau
- Language: English
- Number of Pages: 160
- Publisher: ➤ World Scientific Publishing Company
- Publish Date: September 1999
“Infrared Characterization for Microelectronics” Subjects and Themes:
- Subjects: Materials - Testing - Microelectronics - Infrared spectroscopy - Absorption spectra
Edition Specifications:
- Format: Hardcover
- Weight: 8.8 ounces
- Dimensions: 8.6 x 6.2 x 0.6 inches
Edition Identifiers:
- The Open Library ID: OL9194419M - OL9146817W
- Online Computer Library Center (OCLC) ID: 42296475
- Library of Congress Control Number (LCCN): 99044781
- ISBN-13: 9789810223526
- ISBN-10: 9810223528
- All ISBNs: 9810223528 - 9789810223526
AI-generated Review of “Infrared Characterization for Microelectronics”:
Snippets and Summary:
When two or more atoms are bonded together to form a molecule, many different modes of mechanical vibration are possible.
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