High performance memory testing - Info and Reading Options
design principles, fault modeling, and self-test
By R. Dean Adams
"High performance memory testing" was published by Kluwer Academic in 2003 - Boston, it has 246 pages and the language of the book is English.
“High performance memory testing” Metadata:
- Title: ➤ High performance memory testing
- Author: R. Dean Adams
- Language: English
- Number of Pages: 246
- Publisher: Kluwer Academic
- Publish Date: 2003
- Publish Location: Boston
“High performance memory testing” Subjects and Themes:
- Subjects: Computer storage devices - Semiconductor storage devices - Testing
Edition Specifications:
- Pagination: xiii, 246 p. :
Edition Identifiers:
- The Open Library ID: OL19288698M - OL8701356W
- Online Computer Library Center (OCLC) ID: 50554142
- Library of Congress Control Number (LCCN): 2002034049
- ISBN-10: 1402072554
- All ISBNs: 1402072554
AI-generated Review of “High performance memory testing”:
"High performance memory testing" Description:
The Open Library:
"High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test is Written for the professional and the researcher to help them understand the memories that are being tested."--Jacket.
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