Fault-tolerant parallel and distributed systems - Info and Reading Options
By David R. Kaeli

"Fault-tolerant parallel and distributed systems" was published by Kluwer Academic in 1998 - Boston, Mass, it has 399 pages and the language of the book is English.
“Fault-tolerant parallel and distributed systems” Metadata:
- Title: ➤ Fault-tolerant parallel and distributed systems
- Author: David R. Kaeli
- Language: English
- Number of Pages: 399
- Publisher: Kluwer Academic
- Publish Date: 1998
- Publish Location: Boston, Mass
“Fault-tolerant parallel and distributed systems” Subjects and Themes:
- Subjects: ➤ Parallel processing (Electronic computers) - Distributed processing - Fault-tolerant computing - Electronic data processing - Electronic data processing, distributed processing
Edition Specifications:
- Pagination: xiii, 399p. :
Edition Identifiers:
- The Open Library ID: OL22348514M - OL18257634W
- Online Computer Library Center (OCLC) ID: 37862684
- Library of Congress Control Number (LCCN): 97039030
- ISBN-10: 079238069X
- All ISBNs: 079238069X
AI-generated Review of “Fault-tolerant parallel and distributed systems”:
"Fault-tolerant parallel and distributed systems" Description:
The Open Library:
The most important uses of computing in the future will be those related to the global "digital convergence" where all computing becomes digital and internetworked. This convergence will be propelled by new and advanced applications in storage, searching, retrieval and exchanging of information in a myriad of forms. All of these will place heavy demands on large parallel and distributed computer systems because these systems have high intrinsic failure rates. The challenge to the computer scientist is to build a system that is inexpensive, accessible and dependable. The chapters in this book provide insight into many of these issues and others that will challenge researchers and applications developers. Fault-Tolerant Parallel and Distributed Systems is a coherent and uniform collection of chapters with contributions by several of the leading experts working on fault-resilient applications. The numerous techniques and methods included will be of special interest to researchers, developers, and graduate students.
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