Fault-sensitivity and wear-out analysis of VLSI sensitivity - Info and Reading Options
By Gwan Seung Choi
"Fault-sensitivity and wear-out analysis of VLSI sensitivity" was published by Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign in 1994 - [Urbana, IL] and the language of the book is English.
“Fault-sensitivity and wear-out analysis of VLSI sensitivity” Metadata:
- Title: ➤ Fault-sensitivity and wear-out analysis of VLSI sensitivity
- Author: Gwan Seung Choi
- Language: English
- Publisher: ➤ Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign
- Publish Date: 1994
- Publish Location: [Urbana, IL]
“Fault-sensitivity and wear-out analysis of VLSI sensitivity” Subjects and Themes:
- Subjects: ➤ Chips (Electronics) - Failure analysis - Monte Carlo method - Statistical analysis - Switching circuits - Very large scale integration
Edition Specifications:
- Format: Microform
- Pagination: 1 v.
Edition Identifiers:
- The Open Library ID: OL18076611M - OL11562999W
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