Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits - Info and Reading Options
By M. Bushnell and Vishwani Agrawal
"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits" is published by Springer in Apr 07, 2013 - New York and it has 708 pages.
“Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits” Metadata:
- Title: ➤ Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
- Authors: M. BushnellVishwani Agrawal
- Number of Pages: 708
- Publisher: Springer
- Publish Date: Apr 07, 2013
- Publish Location: New York
“Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits” Subjects and Themes:
- Subjects: ➤ Integrated circuits, very large scale integration - Digital integrated circuits - General - Computer science - Electrical - Cad-cam - Professional, career & trade -> electronics -> general - Professional, career & trade -> computer science -> computer science - Professional, career & trade -> electronics -> circuits - Professional, career & trade -> engineering -> electrical & electronics engineering - Professional, career & trade -> computer science -> cad-cam - Sct24027 - Sci16005 - Sct24068 - Sct24000 - Sci23044 - 4482 - 2981 - 4927 - 2886 - 4456 - Suco11647
Edition Specifications:
- Format: paperback
Edition Identifiers:
- The Open Library ID: OL27982930M - OL20695997W
- ISBN-13: 9781475781427 - 9780792379911 - 9780306470400
- ISBN-10: 1475781423
- All ISBNs: 1475781423 - 9781475781427 - 9780792379911 - 9780306470400
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