Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits - Info and Reading Options
By Michael L. Bushnell and Vishwani D. Agrawal
"Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits" was published by Kluwer Academic in 2000 - Boston, it has 690 pages and the language of the book is English.
“Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits” Metadata:
- Title: ➤ Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
- Authors: Michael L. BushnellVishwani D. Agrawal
- Language: English
- Number of Pages: 690
- Publisher: Kluwer Academic
- Publish Date: 2000
- Publish Location: Boston
“Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits” Subjects and Themes:
- Subjects: ➤ Digital integrated circuits - Integrated circuits - Mixed signal circuits - Semiconductor storage devices - Testing - Very large scale integration - Electronic devices & materials - General Theory of Computing - Electronic Measurements - Very-Large-Scale Integration (Vlsi) - Technology - Technology & Industrial Arts - Textbooks - Science/Mathematics - Electronics - Circuits - General - Engineering - Electrical & Electronic - General - Technology / Electronics / Circuits / General - Electronics - Circuits - VLSI - Integrated circuits, very large scale integration
Edition Specifications:
- Pagination: xviii, 690 p. :
Edition Identifiers:
- The Open Library ID: OL18159065M - OL4618093W
- Online Computer Library Center (OCLC) ID: 70916145 - 44926977
- Library of Congress Control Number (LCCN): 00046212
- ISBN-10: 0792379918
- All ISBNs: 0792379918
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