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Electron Beam-Specimen Interactions and Simulation Methods in Microscopy

"Electron Beam-Specimen Interactions and Simulation Methods in Microscopy" was published by Wiley & Sons, Limited, John in 2018, it has 296 pages and the language of the book is English.


“Electron Beam-Specimen Interactions and Simulation Methods in Microscopy” Metadata:

  • Title: ➤  Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
  • Author:
  • Language: English
  • Number of Pages: 296
  • Publisher: Wiley & Sons, Limited, John
  • Publish Date:

“Electron Beam-Specimen Interactions and Simulation Methods in Microscopy” Subjects and Themes:

Edition Specifications:

  • Weight: 0.666

Edition Identifiers:

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