Electron Beam Ion Sources And Traps And Their Applications - Info and Reading Options
8th International Symposium (AIP Conference Proceedings)
By K. Prelec
"Electron Beam Ion Sources And Traps And Their Applications" was published by Springer in 2001, it has 314 pages and the language of the book is English.
“Electron Beam Ion Sources And Traps And Their Applications” Metadata:
- Title: ➤ Electron Beam Ion Sources And Traps And Their Applications
- Author: K. Prelec
- Language: English
- Number of Pages: 314
- Publisher: Springer
- Publish Date: 2001
“Electron Beam Ion Sources And Traps And Their Applications” Subjects and Themes:
- Subjects: Ion sources - Congresses - Electron beams - Trapped ions
Edition Specifications:
- Format: Hardcover
- Weight: 1.4 pounds
- Dimensions: 9.6 x 6.5 x 0.9 inches
Edition Identifiers:
- The Open Library ID: OL10597338M - OL8874794W
- Online Computer Library Center (OCLC) ID: 47927783
- Library of Congress Control Number (LCCN): 2001091142
- ISBN-13: 9780735400115
- ISBN-10: 0735400113
- All ISBNs: 0735400113 - 9780735400115
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