Eighth IEEE Symposium on Software Metrics - Info and Reading Options
[METRICS 2002], 4-7 June, 2002, Ottawa, Canada
By International Software Metrics Symposium (8th 2002 Ottawa, Ont.)
"Eighth IEEE Symposium on Software Metrics" was published by IEEE Computer Society in 2002 - Los Alamitos, Calif, it has 259 pages and the language of the book is English.
“Eighth IEEE Symposium on Software Metrics” Metadata:
- Title: ➤ Eighth IEEE Symposium on Software Metrics
- Author: ➤ International Software Metrics Symposium (8th 2002 Ottawa, Ont.)
- Language: English
- Number of Pages: 259
- Publisher: IEEE Computer Society
- Publish Date: 2002
- Publish Location: Los Alamitos, Calif
“Eighth IEEE Symposium on Software Metrics” Subjects and Themes:
- Subjects: Congresses - Computer software - Quality control - Software maintenance - Software measurement
Edition Specifications:
- Pagination: xi, 259 p. :
Edition Identifiers:
- The Open Library ID: OL20524108M - OL13150412W
- Online Computer Library Center (OCLC) ID: 50021208 - 692326030
- Library of Congress Control Number (LCCN): 2001106019
- ISBN-10: 0769513395
- All ISBNs: 0769513395
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