DTIC ADA128651: State-of-the-Art Assessment Of Testing And Testability Of Custom LSI/VLSI Circuits. Volume III. Fault Model Analysis. - Info and Reading Options
By Defense Technical Information Center
"DTIC ADA128651: State-of-the-Art Assessment Of Testing And Testability Of Custom LSI/VLSI Circuits. Volume III. Fault Model Analysis." and the language of the book is English.
“DTIC ADA128651: State-of-the-Art Assessment Of Testing And Testability Of Custom LSI/VLSI Circuits. Volume III. Fault Model Analysis.” Metadata:
- Title: ➤ DTIC ADA128651: State-of-the-Art Assessment Of Testing And Testability Of Custom LSI/VLSI Circuits. Volume III. Fault Model Analysis.
- Author: ➤ Defense Technical Information Center
- Language: English
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- Internet Archive ID: DTIC_ADA128651
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"DTIC ADA128651: State-of-the-Art Assessment Of Testing And Testability Of Custom LSI/VLSI Circuits. Volume III. Fault Model Analysis." Description:
The Internet Archive:
Physical failure in LSI/VSLI circuits is highly dependent on the fabrication technology being used and result in a very complex faulty behavior. To reduce numbers and types of faults that must be handled for test generating and fault simulation, logic fault models are used. The most popular fault model is the single stuck line (SSL) which can emulate many common physical faults. Non-standard faults like short circuits are more difficult to model-usually require modification to the original circuit to allow use of SSL software. This approach is also ideal for handling Complementary Metal oxide Semiconductors faults. (Author)
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