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The Physics And Chemistry Of Sio2 And The Si Sio2 Interface by Symposium On The Physics And Chemistry Of Sio₂ And The Si Sio₂ Interface (1st 1988 Atlanta%2c Ga.)
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1DTIC ADA193176: Silicon Oxidation Studies: A Review Of Recent Studies On Thin Film Silicon Dioxide Formation In The Physics And Chemistry Of SiO2 And The Si-SiO2 Interface.
By Defense Technical Information Center
When X raying rocket propulsion systems during testing, periodic noise can corrupt the overall quality of an X ray image. This periodic noise results from vibrations caused by the rocket firing and/or from the pulsing of the X ray source. A method of removing band-limited noise for enhancement of real-time radiographic images of propulsion systems under test conditions is, therefore, desired to improve data analysis. This investigation compares the Fourier and spatial techniques relative to their ability to eliminate random and periodic noise. Fast Fourier transform (FFT) techniques are discussed with respect to efficiency and ease of implementation. Methods of removing low- and high-frequency and band-limited noise are demonstrated using both Fourier and spatial techniques. The radix-2 method of performing an FFT was selected for this investigation because of ease of implementation and reasonable computation time for a data transfer processor. The Fourier domain techniques were found to be better suited for removing band-limited periodic noise because extensive spatial filtering by means of frame averaging destroys the time resolution of the image. Keywords: X ray inspection, Nonintrusive diagnostic techniques, Frequency domain filtering, Solid propellant rocket motors.
“DTIC ADA193176: Silicon Oxidation Studies: A Review Of Recent Studies On Thin Film Silicon Dioxide Formation In The Physics And Chemistry Of SiO2 And The Si-SiO2 Interface.” Metadata:
- Title: ➤ DTIC ADA193176: Silicon Oxidation Studies: A Review Of Recent Studies On Thin Film Silicon Dioxide Formation In The Physics And Chemistry Of SiO2 And The Si-SiO2 Interface.
- Author: ➤ Defense Technical Information Center
- Language: English
“DTIC ADA193176: Silicon Oxidation Studies: A Review Of Recent Studies On Thin Film Silicon Dioxide Formation In The Physics And Chemistry Of SiO2 And The Si-SiO2 Interface.” Subjects and Themes:
- Subjects: ➤ DTIC Archive - Irene, E A - NORTH CAROLINA UNIV AT CHAPEL HILL DEPT OF CHEMISTRY - *OXIDATION - *SILICON - *SILICON DIOXIDE - *THIN FILMS - AVAILABILITY - CRYSTALS - ELECTRONS - FILMS - IMPURITIES - ORIENTATION(DIRECTION) - PHYSICS - SINGLE CRYSTALS - STRESSES - SUBSTRATES - THERMOCHEMISTRY - THINNESS
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- Internet Archive ID: DTIC_ADA193176
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The book is available for download in "texts" format, the size of the file-s is: 14.24 Mbs, the file-s for this book were downloaded 75 times, the file-s went public at Sun Feb 18 2018.
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