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1Linear Circuits : Analysis And Synthesis

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  • Title: ➤  Linear Circuits : Analysis And Synthesis
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2Linear Circuits Current Loop Fault Detector

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3Linear Circuits Filter Design On A Budgetand More Filter Designona Budget-SLOA065and SLOA096OCR

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4Linear Circuits-TEMPERATURETO4-20m ATRANSMITTEROCR

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5Motorola Linear And Interface Integrated Circuits 1983

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Motorola Linear and Interface Integrated Circuits 1983

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6National Semiconductor Linear Integrated Circuits Jun 1973

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National Semiconductor Linear Integrated Circuits Jun 1973

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7Unitrode :: DataBooks :: 1987 Unitrode Linear Integrated Circuits Databook

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8Signals In Linear Circuits

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xviii, 594 pages 25 cm

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9Linear And Interface Circuits Applications

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xviii, 594 pages 25 cm

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10Signals In Linear Circuits

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xviii, 594 pages 25 cm

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11Non-linear Phenomena In Electrical Circuits: Simulation Of Non-linear Relativistic Field Theory And Possible Applications

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We propose the non-accelerator non-low-temperature simulator of quantum-field effects which is based on the feeder circuits with the special feedback. By means of it one can study the field models which contain fundamental concepts in the modern field theory but do not exist in nature in a separate form. Besides, several field phenomena might find technological applications by virtue of the electrical analogy.

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12Instructor's Manual To Accompany The Analysis And Design Of Linear Circuits

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364 p. : 25 cm

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13Operational Amplifiers With Linear Integrated Circuits

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364 p. : 25 cm

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14Texas Instruments Military Linear Circuits Product Baseline Cross Reference Guides And Data Sheets Data Book 1992

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Texas Instruments Military Linear Circuits Product Baseline Cross Reference Guides And Data Sheets Data Book 1992

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15A Study Of Linear Feedback Shift Register Circuits Over Gf(2n)

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Book Source: Digital Library of India Item 2015.192114 dc.contributor.author: Shakeel Ahmad dc.date.accessioned: 2015-07-08T01:17:41Z dc.date.available: 2015-07-08T01:17:41Z dc.date.digitalpublicationdate: 2005-09-08 dc.identifier.barcode: 1990010090568 dc.identifier.origpath: /rawdataupload/upload/0090/568 dc.identifier.copyno: 1 dc.identifier.uri: http://www.new.dli.ernet.in/handle/2015/192114 dc.description.scannerno: 12 dc.description.scanningcentre: IIIT, Allahabad dc.description.main: 1 dc.description.tagged: 0 dc.description.totalpages: 144 dc.format.mimetype: application/pdf dc.language.iso: English dc.publisher: Indian Institute Of Technology Kanpur dc.rights: Out_of_copyright dc.source.library: Indian Institute Of Technology Kanpur dc.subject.classification: Technology dc.subject.classification: Engineering. Technology In General dc.subject.classification: Mechanical Engineering In General. Nuclear Technology. Electrical Engineering. Machinery dc.title: A Study Of Linear Feedback Shift Register Circuits Over Gf(2n)

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16DTIC ADA161278: A Piecewise-Linear Approach To DC Analysis Of Large-Scale Integrated Circuits.

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Katzenelson's algorithm and its variants are powerful tools for solving nonlilnear networks which are modeled by piecewise-linear characteristics. But, when nonlinear network sizes become very large such as in VLSI chip cases, excessive cpu time and storage are required during the solution process using Katzenelson's algorithms. Decomposition techniques are necessary in the analysis of VLSI circuits. Nonlinear Gauss-Seidel iterative methods are often adopted in solving large decomposed system of equations. However, Nonlinear Gauss-Seidel iterative process will converge under certain conditions. The combination of Katzenelson and Gauss-Seidel methods proposed here takes advantages of both Katzenelson and the Gauss-Seidel methods. It decomposes the whole network into small subcircuits by Gauss-Seidel method and solves these small subcircuits by Katzenelson's algorithm separately (or even these subcircuits can be solved by Katzenelson's at same time with parallel processors, if Jacobi Method is used as decompositions technique). The convergence properties of the method is studies in detail, and examples are given here to illustrate the approach in the dc analysis of bipolar and MOS transistors circuits: Keywords: Nonlinear integrated circuits; Convergence; Computer programs; Schematic diagrams.

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17DTIC AD0861267: Linear Integrated Circuits (Field Effect RF Amplifier/Mixer Integrated Circuits)

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An integrated MOS RF amplifier-mixer circuit, capable of receiving FM signals in the 30- to 76-megahertz frequency range, was developed successfully. The front end IC essentially met or surpassed contract specifications on sensitivity, power gain, desensitization, and spurious response. The performance of the integrated-circuit compared favorably to results obtained from circuits using discrete devices. The circuit, which consists of seven p-channel MOS enhancement devices fabricated on a common substrate, uses MOS dual-gate devices in both the direct-coupled RF amplifier and mixer stages. The MOS transistors necessary to bias these stages are included on the 30-by 40-mil pellet. The RF amplifier-mixer IC was evaluated in a typical military FM receiver at 30 and 76 megahertz. The circuit exhibited an excellent sensitivity of 0.35 and 0.4 of a hard microvolt at 30 and 76 megahertz, respectively, for a 10-dB signal plus noise-to-noise ratio at the audio output. Power gain and dissipation was 34.0 dB and approximately 100 milliwatts, respectively, for a 9-volt supply at both 30 and 76 megahertz. Desensitization results were very good with interfering signal levels, removed by 10 percent from the desired channel frequency, of at least 122 dB above the reference level required to degrade the 10-dB signal plus noise-to-noise ratio to 6 dB. The integrated RF amplifier-mixer was operated in a varactor-tuned assembly, and performed well over the 63- to 76-megahertz band.

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18LINEAR Application Note 23 Micropower Circuits For Signal Conditioning Handbook

An integrated MOS RF amplifier-mixer circuit, capable of receiving FM signals in the 30- to 76-megahertz frequency range, was developed successfully. The front end IC essentially met or surpassed contract specifications on sensitivity, power gain, desensitization, and spurious response. The performance of the integrated-circuit compared favorably to results obtained from circuits using discrete devices. The circuit, which consists of seven p-channel MOS enhancement devices fabricated on a common substrate, uses MOS dual-gate devices in both the direct-coupled RF amplifier and mixer stages. The MOS transistors necessary to bias these stages are included on the 30-by 40-mil pellet. The RF amplifier-mixer IC was evaluated in a typical military FM receiver at 30 and 76 megahertz. The circuit exhibited an excellent sensitivity of 0.35 and 0.4 of a hard microvolt at 30 and 76 megahertz, respectively, for a 10-dB signal plus noise-to-noise ratio at the audio output. Power gain and dissipation was 34.0 dB and approximately 100 milliwatts, respectively, for a 9-volt supply at both 30 and 76 megahertz. Desensitization results were very good with interfering signal levels, removed by 10 percent from the desired channel frequency, of at least 122 dB above the reference level required to degrade the 10-dB signal plus noise-to-noise ratio to 6 dB. The integrated RF amplifier-mixer was operated in a varactor-tuned assembly, and performed well over the 63- to 76-megahertz band.

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19Components :: Ti :: DataBooks :: 1989 TI Linear Circuits Amplifiers Comparators And Special Functions Volume 1

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20Williams_06_-_1995_-_EDN_-_A_designer_s_guide_to_Innovative_Linear_Circuits

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21The Analysis Of Linear Circuits

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22Fundamentals Of Linear Circuits

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23Linear Integrated Circuits

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24Lab Manual To Accompany Op-amps And Linear Integrated Circuits, Fourth Edition

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vii, 152 pages ; 28 cm

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25Linear Integrated Circuits In A Channelized High-frequency Receiver.

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vii, 152 pages ; 28 cm

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26Linear Integrated Circuits In A Channelized High-frequency Receiver.

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ADA708045

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27Linear Electric Circuits

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xx, 603 p. 24 cm

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28Linear Circuits Circuit Measures Small Currents Referenced To High Voltage Rails OCR

xx, 603 p. 24 cm

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29Linear Circuits Handbook Of Operational Amplifier Active RC Networks-sboa093a

xx, 603 p. 24 cm

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30Linear Circuits Single Supply Op Amp Design Techniques-sloa030a

xx, 603 p. 24 cm

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31Linear Circuits-13-bitlinear4-20m Atransmitter

xx, 603 p. 24 cm

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32National Semiconductor LP5900 Ultra Low Noise 100 MA Linear Regulator For RF/Analog Circuits Requires No Bypass Capacitor Handbook

xx, 603 p. 24 cm

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33LINEAR AN46 Efficiency Characteristics Of Switching Regulator Circuits Handbook

xx, 603 p. 24 cm

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34NASA Technical Reports Server (NTRS) 20050210087: Single Event Transients In Linear Integrated Circuits

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On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The reset caused the spacecraft to enter a safehold mode from which it took several days to recover. Were that to happen regularly, the entire mission would be compromised, so it was important to find the cause of the reset and, if possible, to mitigate it. NASA assembled a team of engineers that included experts in radiation effects to tackle the problem. The first clue was the observation that the processor reset occurred during a solar event characterized by large increases in the proton and heavy ion fluxes emitted by the sun. To the radiation effects engineers on the team, this strongly suggested that particle radiation might be the culprit, particularly when it was discovered that the reset circuit contained three voltage comparators (LM139). Previous testing revealed that large voltage transients, or glitches appeared at the output of the LM139 when it was exposed to a beam of heavy ions [NI96]. The function of the reset circuit was to monitor the supply voltage and to issue a reset command to the processor should the voltage fall below a reference of 2.5 V [PO02]. Eventually, the team of engineers concluded that ionizing particle radiation from the solar event produced a negative voltage transient on the output of one of the LM139s sufficiently large to reset the processor on MAP. Fortunately, as of the end of 2004, only two such resets have occurred. The reset on MAP was not the first malfunction on a spacecraft attributed to a transient. That occurred shortly after the launch of NASA s TOPEX/Poseidon satellite in 1992. It was suspected, and later confirmed, that an anomaly in the Earth Sensor was caused by a transient in an operational amplifier (OP-15) [KO93]. Over the next few years, problems on TDRS, CASSINI, [PR02] SOHO [HA99,HA01] and TERRA were also attributed to transients. In some cases, such events produced resets by falsely triggering circuits designed to protect against over- voltage or over-current. On at least three occasions, transients caused satellites to switch into "safe mode" in which most of the systems on board the satellites were powered down for an extended period. By the time the satellites were reconfigured and returned to full operational state, much scientific data had been lost. Fortunately, no permanent damage occurred in any of the systems and they were all successfully re-activated.

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35Linear Circuits Whats All This Sallen Key Stuff Anyhow OCR

On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The reset caused the spacecraft to enter a safehold mode from which it took several days to recover. Were that to happen regularly, the entire mission would be compromised, so it was important to find the cause of the reset and, if possible, to mitigate it. NASA assembled a team of engineers that included experts in radiation effects to tackle the problem. The first clue was the observation that the processor reset occurred during a solar event characterized by large increases in the proton and heavy ion fluxes emitted by the sun. To the radiation effects engineers on the team, this strongly suggested that particle radiation might be the culprit, particularly when it was discovered that the reset circuit contained three voltage comparators (LM139). Previous testing revealed that large voltage transients, or glitches appeared at the output of the LM139 when it was exposed to a beam of heavy ions [NI96]. The function of the reset circuit was to monitor the supply voltage and to issue a reset command to the processor should the voltage fall below a reference of 2.5 V [PO02]. Eventually, the team of engineers concluded that ionizing particle radiation from the solar event produced a negative voltage transient on the output of one of the LM139s sufficiently large to reset the processor on MAP. Fortunately, as of the end of 2004, only two such resets have occurred. The reset on MAP was not the first malfunction on a spacecraft attributed to a transient. That occurred shortly after the launch of NASA s TOPEX/Poseidon satellite in 1992. It was suspected, and later confirmed, that an anomaly in the Earth Sensor was caused by a transient in an operational amplifier (OP-15) [KO93]. Over the next few years, problems on TDRS, CASSINI, [PR02] SOHO [HA99,HA01] and TERRA were also attributed to transients. In some cases, such events produced resets by falsely triggering circuits designed to protect against over- voltage or over-current. On at least three occasions, transients caused satellites to switch into "safe mode" in which most of the systems on board the satellites were powered down for an extended period. By the time the satellites were reconfigured and returned to full operational state, much scientific data had been lost. Fortunately, no permanent damage occurred in any of the systems and they were all successfully re-activated.

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36Linear Circuits-CN01454m A-to-20m A Loop Powered Temperature Monitor Usingthe A Du C7060or A Du C7061 Precision Analog Microcontroller

On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The reset caused the spacecraft to enter a safehold mode from which it took several days to recover. Were that to happen regularly, the entire mission would be compromised, so it was important to find the cause of the reset and, if possible, to mitigate it. NASA assembled a team of engineers that included experts in radiation effects to tackle the problem. The first clue was the observation that the processor reset occurred during a solar event characterized by large increases in the proton and heavy ion fluxes emitted by the sun. To the radiation effects engineers on the team, this strongly suggested that particle radiation might be the culprit, particularly when it was discovered that the reset circuit contained three voltage comparators (LM139). Previous testing revealed that large voltage transients, or glitches appeared at the output of the LM139 when it was exposed to a beam of heavy ions [NI96]. The function of the reset circuit was to monitor the supply voltage and to issue a reset command to the processor should the voltage fall below a reference of 2.5 V [PO02]. Eventually, the team of engineers concluded that ionizing particle radiation from the solar event produced a negative voltage transient on the output of one of the LM139s sufficiently large to reset the processor on MAP. Fortunately, as of the end of 2004, only two such resets have occurred. The reset on MAP was not the first malfunction on a spacecraft attributed to a transient. That occurred shortly after the launch of NASA s TOPEX/Poseidon satellite in 1992. It was suspected, and later confirmed, that an anomaly in the Earth Sensor was caused by a transient in an operational amplifier (OP-15) [KO93]. Over the next few years, problems on TDRS, CASSINI, [PR02] SOHO [HA99,HA01] and TERRA were also attributed to transients. In some cases, such events produced resets by falsely triggering circuits designed to protect against over- voltage or over-current. On at least three occasions, transients caused satellites to switch into "safe mode" in which most of the systems on board the satellites were powered down for an extended period. By the time the satellites were reconfigured and returned to full operational state, much scientific data had been lost. Fortunately, no permanent damage occurred in any of the systems and they were all successfully re-activated.

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37Linear Circuits Anintroductiontodepletionmode MOSFE Ts

On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The reset caused the spacecraft to enter a safehold mode from which it took several days to recover. Were that to happen regularly, the entire mission would be compromised, so it was important to find the cause of the reset and, if possible, to mitigate it. NASA assembled a team of engineers that included experts in radiation effects to tackle the problem. The first clue was the observation that the processor reset occurred during a solar event characterized by large increases in the proton and heavy ion fluxes emitted by the sun. To the radiation effects engineers on the team, this strongly suggested that particle radiation might be the culprit, particularly when it was discovered that the reset circuit contained three voltage comparators (LM139). Previous testing revealed that large voltage transients, or glitches appeared at the output of the LM139 when it was exposed to a beam of heavy ions [NI96]. The function of the reset circuit was to monitor the supply voltage and to issue a reset command to the processor should the voltage fall below a reference of 2.5 V [PO02]. Eventually, the team of engineers concluded that ionizing particle radiation from the solar event produced a negative voltage transient on the output of one of the LM139s sufficiently large to reset the processor on MAP. Fortunately, as of the end of 2004, only two such resets have occurred. The reset on MAP was not the first malfunction on a spacecraft attributed to a transient. That occurred shortly after the launch of NASA s TOPEX/Poseidon satellite in 1992. It was suspected, and later confirmed, that an anomaly in the Earth Sensor was caused by a transient in an operational amplifier (OP-15) [KO93]. Over the next few years, problems on TDRS, CASSINI, [PR02] SOHO [HA99,HA01] and TERRA were also attributed to transients. In some cases, such events produced resets by falsely triggering circuits designed to protect against over- voltage or over-current. On at least three occasions, transients caused satellites to switch into "safe mode" in which most of the systems on board the satellites were powered down for an extended period. By the time the satellites were reconfigured and returned to full operational state, much scientific data had been lost. Fortunately, no permanent damage occurred in any of the systems and they were all successfully re-activated.

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38Linear Circuits Smallcircuitformsprogrammable4-to20-m Atransmitter OCR

On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The reset caused the spacecraft to enter a safehold mode from which it took several days to recover. Were that to happen regularly, the entire mission would be compromised, so it was important to find the cause of the reset and, if possible, to mitigate it. NASA assembled a team of engineers that included experts in radiation effects to tackle the problem. The first clue was the observation that the processor reset occurred during a solar event characterized by large increases in the proton and heavy ion fluxes emitted by the sun. To the radiation effects engineers on the team, this strongly suggested that particle radiation might be the culprit, particularly when it was discovered that the reset circuit contained three voltage comparators (LM139). Previous testing revealed that large voltage transients, or glitches appeared at the output of the LM139 when it was exposed to a beam of heavy ions [NI96]. The function of the reset circuit was to monitor the supply voltage and to issue a reset command to the processor should the voltage fall below a reference of 2.5 V [PO02]. Eventually, the team of engineers concluded that ionizing particle radiation from the solar event produced a negative voltage transient on the output of one of the LM139s sufficiently large to reset the processor on MAP. Fortunately, as of the end of 2004, only two such resets have occurred. The reset on MAP was not the first malfunction on a spacecraft attributed to a transient. That occurred shortly after the launch of NASA s TOPEX/Poseidon satellite in 1992. It was suspected, and later confirmed, that an anomaly in the Earth Sensor was caused by a transient in an operational amplifier (OP-15) [KO93]. Over the next few years, problems on TDRS, CASSINI, [PR02] SOHO [HA99,HA01] and TERRA were also attributed to transients. In some cases, such events produced resets by falsely triggering circuits designed to protect against over- voltage or over-current. On at least three occasions, transients caused satellites to switch into "safe mode" in which most of the systems on board the satellites were powered down for an extended period. By the time the satellites were reconfigured and returned to full operational state, much scientific data had been lost. Fortunately, no permanent damage occurred in any of the systems and they were all successfully re-activated.

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39Deterministic Linear Optics Quantum Computation Utilizing Linked Photon Circuits

By

We suggest an efficient scheme for quantum computation with linear optical elements utilizing "linked" photon states. The linked states are designed according to the particular quantum circuit one wishes to process. Once a linked-state has been successfully prepared, the computation is pursued deterministically by a sequence of teleportation steps. The present scheme enables a significant reduction of the average number of elementary gates per logical gate to about 20-30 CZ_{9/16} gates.

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40Super-Linear Gate And Super-Quadratic Wire Lower Bounds For Depth-Two And Depth-Three Threshold Circuits

By

In order to formally understand the power of neural computing, we first need to crack the frontier of threshold circuits with two and three layers, a regime that has been surprisingly intractable to analyze. We prove the first super-linear gate lower bounds and the first super-quadratic wire lower bounds for depth-two linear threshold circuits with arbitrary weights, and depth-three majority circuits computing an explicit function. $\bullet$ We prove that for all $\epsilon\gg \sqrt{\log(n)/n}$, the linear-time computable Andreev's function cannot be computed on a $(1/2+\epsilon)$-fraction of $n$-bit inputs by depth-two linear threshold circuits of $o(\epsilon^3 n^{3/2}/\log^3 n)$ gates, nor can it be computed with $o(\epsilon^{3} n^{5/2}/\log^{7/2} n)$ wires. This establishes an average-case ``size hierarchy'' for threshold circuits, as Andreev's function is computable by uniform depth-two circuits of $o(n^3)$ linear threshold gates, and by uniform depth-three circuits of $O(n)$ majority gates. $\bullet$ We present a new function in $P$ based on small-biased sets, which we prove cannot be computed by a majority vote of depth-two linear threshold circuits with $o(n^{3/2}/\log^3 n)$ gates, nor with $o(n^{5/2}/\log^{7/2}n)$ wires. $\bullet$ We give tight average-case (gate and wire) complexity results for computing PARITY with depth-two threshold circuits; the answer turns out to be the same as for depth-two majority circuits. The key is a new random restriction lemma for linear threshold functions. Our main analytical tool is the Littlewood-Offord Lemma from additive combinatorics.

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41National :: DataBooks :: 1972 National Linear Integrated Circuits

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42Components :: Panasonic :: DataBooks :: 1987 Panasonic Linear Integrated Circuits ICs For Video

From the bitsavers.org collection, a scanned-in computer-related document. components :: panasonic :: dataBooks :: 1987 Panasonic Linear Integrated Circuits ICs for Video

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43Components :: Raytheon :: DataBooks :: 1989 Rayetheon Linear Integrated Circuits

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44Sgs :: DataBooks :: 1982 Linear Integrated Circuits 3ed

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45Linear Integrated Circuits: What's Available?

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linear ics 11 66

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46Principles And Design Of Linear Active Circuits

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47Linear Integrated Circuits

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48Linear Circuits Bootstrapping Your Op Amp Yields Wide Voltage Swings OCR

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49Linear Circuits Designing Antialias Filters For AD Cs OCR

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50Linear Circuits Operationalamplifiergainstability Part2D Cgain-erroranalysis

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