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Dtic Ada408654%3a Hedm Source Characterization By Multi Photon Ionization Time Of Flight Mass Spectrometry by Defense Technical Information Center

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1DTIC ADA408654: HEDM Source Characterization By Multi-Photon Ionization Time-of-Flight Mass Spectrometry

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We present results obtained using an apparatus designed to characterize the species produced by a variety of HEDM sources. In this apparatus, the HEDM species are ionized by a pulsed excimer laser beam and analyzed by time-of-flight mass spectrometry. Complications arising from photofragmentation vs. photoionization were encountered and documented as a function of ionization wavelength and intensity.

“DTIC ADA408654: HEDM Source Characterization By Multi-Photon Ionization Time-of-Flight Mass Spectrometry” Metadata:

  • Title: ➤  DTIC ADA408654: HEDM Source Characterization By Multi-Photon Ionization Time-of-Flight Mass Spectrometry
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  • Language: English

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