Downloads & Free Reading Options - Results
Dtic Ada165516%3a The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials by Defense Technical Information Center
Read "Dtic Ada165516%3a The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials" by Defense Technical Information Center through these free online access and download options.
Books Results
Source: The Internet Archive
The internet Archive Search Results
Available books for downloads and borrow from The internet Archive
1DTIC ADA165516: The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials
By Defense Technical Information Center
This document evaluate the applications potential of sputtered neutral mass spectrometry (SNMS) as implemented in the INA-3 for advanced materials characterization. The report will detail initial hands-on experiences with SNMS via the prototype version of the INA-3. The key functional components and parameters are: 1. The rf plasma uniquely established by pressure, rf power and external DC magnetic field, 2. Ion extraction optics consisting of an extraction electrode, focusing lens, 30 deg electrostatic analyzer (ESA) and transfer elements required to transport the energy filtered ion beam into a quadrupole mass spectrometer. 3. A conventional quadrupole mass filter with electron multiplier detector, and 4. The target bias supply. In the latter case, the Kaiserslautern instrument references the target potential to the plasma potential via a Langmuir probe, whereas the INA-3 presently references the target power supply to ground potential (i.e., no Langmuir probe). Our studies to date have indicated that a Langmuir reference might make a significant improvement.
“DTIC ADA165516: The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials” Metadata:
- Title: ➤ DTIC ADA165516: The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials
- Author: ➤ Defense Technical Information Center
- Language: English
“DTIC ADA165516: The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials” Subjects and Themes:
- Subjects: ➤ DTIC Archive - Reed, David A - EVANS (CHARLES) AND ASSOCIATES SAN MATEO CA - *ELECTRONIC STATES - *MASS SPECTROMETRY - *SEMICONDUCTORS - BIAS - DEPTH - DETECTORS - DIRECT CURRENT - ELECTRODES - ELECTRON LENSES - ELECTRON MULTIPLIERS - ELECTROSTATIC ANALYZERS - ENERGY - EXTERNAL - EXTRACTION - FILTERS - FOCUSING - ION BEAMS - IONS - LANGMUIR PROBES - MAGNETIC FIELDS - MASS SPECTROMETERS - NEUTRAL - OPTICS - PLASMAS(PHYSICS) - POWER SUPPLIES - PROFILES - QUADRUPOLE MOMENT - RADIOFREQUENCY - RADIOFREQUENCY POWER - SPUTTERING - TRANSFER - TRANSPORT PROPERTIES
Edition Identifiers:
- Internet Archive ID: DTIC_ADA165516
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 11.53 Mbs, the file-s for this book were downloaded 57 times, the file-s went public at Tue Feb 06 2018.
Available formats:
Abbyy GZ - Archive BitTorrent - DjVuTXT - Djvu XML - Item Tile - Metadata - OCR Page Index - OCR Search Text - Page Numbers JSON - Scandata - Single Page Processed JP2 ZIP - Text PDF - chOCR - hOCR -
Related Links:
- Whefi.com: Download
- Whefi.com: Review - Coverage
- Internet Archive: Details
- Internet Archive Link: Downloads
Online Marketplaces
Find DTIC ADA165516: The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
Buy “Dtic Ada165516%3a The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials” online:
Shop for “Dtic Ada165516%3a The Development Of Sputtered Neutral Mass Spectrometry For The Quantitative Depth Profiling Of Compound Semiconductor Materials” on popular online marketplaces.
- Ebay: New and used books.