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Dtic Ada1015813%3a Bipolar Transistor And Diode Failure To Electrical Transients Predictive Failure Modeling Versus Experimental Damage Testing. 2. Afwl Transistor And Diode Failure Model. by Defense Technical Information Center
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1DTIC ADA1015813: Bipolar Transistor And Diode Failure To Electrical Transients--Predictive Failure Modeling Versus Experimental Damage Testing. 2. AFWL Transistor And Diode Failure Model.
By Defense Technical Information Center
An investigation of the predictive capability of a new Air Force Weapons Laboratory model for transistor and diode failure under reverse bias was initiated. A comparison with the junction capacitance damage model shows a doubled improvement at high confidence levels based on an Army-generated population of experimental damage data. (Author)
“DTIC ADA1015813: Bipolar Transistor And Diode Failure To Electrical Transients--Predictive Failure Modeling Versus Experimental Damage Testing. 2. AFWL Transistor And Diode Failure Model.” Metadata:
- Title: ➤ DTIC ADA1015813: Bipolar Transistor And Diode Failure To Electrical Transients--Predictive Failure Modeling Versus Experimental Damage Testing. 2. AFWL Transistor And Diode Failure Model.
- Author: ➤ Defense Technical Information Center
- Language: English
“DTIC ADA1015813: Bipolar Transistor And Diode Failure To Electrical Transients--Predictive Failure Modeling Versus Experimental Damage Testing. 2. AFWL Transistor And Diode Failure Model.” Subjects and Themes:
- Subjects: ➤ DTIC Archive - Vrabel,Michael J - HARRY DIAMOND LABS ADELPHI MD - *DIODES - *TRANSISTORS - DAMAGE - PREDICTIONS - MODELS - FAILURE - TEST METHODS - REVERSIBLE - JUNCTIONS - BIAS - CAPACITANCE
Edition Identifiers:
- Internet Archive ID: DTIC_ADA1015813
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 19.61 Mbs, the file-s for this book were downloaded 52 times, the file-s went public at Sun Dec 29 2019.
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