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Dtic Ada098734%3a Accessibility Of Large Scale Electronic Circuits%2c by Defense Technical Information Center
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1DTIC ADA098734: Accessibility Of Large-Scale Electronic Circuits,
By Defense Technical Information Center
The problem of fault diagnosis of large-scale analog circuit is studied. Any fault diagnosis procedure is limited by the number of circuit parameters to be diagnosed. When such limit is exceeded by large-scale circuits, some kind of tearing process has to be implemented before a fault diagnosis procedure can be applied. In this paper, a tearing process via accessibility of subnetworks is presented. The necessary and sufficient condition for accessibility is obtained. The implementation of this tearing process is discussed. The tearing process can be applied to nonlinear circuits. (Author)
“DTIC ADA098734: Accessibility Of Large-Scale Electronic Circuits,” Metadata:
- Title: ➤ DTIC ADA098734: Accessibility Of Large-Scale Electronic Circuits,
- Author: ➤ Defense Technical Information Center
- Language: English
“DTIC ADA098734: Accessibility Of Large-Scale Electronic Circuits,” Subjects and Themes:
- Subjects: ➤ DTIC Archive - Liu, R - NOTRE DAME UNIV IN - *SYSTEMS ENGINEERING - *ANALOG SYSTEMS - *CIRCUIT ANALYSIS - ELECTRONICS - PARAMETERS - PROCESSING - NONLINEAR SYSTEMS - CIRCUITS - FAULTS - TEARING
Edition Identifiers:
- Internet Archive ID: DTIC_ADA098734
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 7.42 Mbs, the file-s for this book were downloaded 50 times, the file-s went public at Wed Dec 13 2017.
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