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This report addresses the problem of high-resolution fault diagnosis in linear, analog electrical circuits in which a limited number of terminals are accessible for measurement. An efficient algorithm is described for computing network responses after a single parameter is changed. The computational complexity of this algorithm has been found to be very superior to that of a conventional algorithm. In addition, the problem of choosing a set of measurements for fault analysis has been studied. We have found necessary conditions for resolving the fault to the component level. The problems of measurement error and numerical conditioning have also been studied. (Author)