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Bstj 53%3a 8. October 1974%3a Lamp%3a Automatic Test Generation For Asynchronous Digital Circuits. (chappell%2c S.g.)
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1BSTJ 53: 8. October 1974: LAMP: Automatic Test Generation For Asynchronous Digital Circuits. (Chappell, S.G.)
Bell System Technical Journal, 53: 8. October 1974 pp 1477-1503. LAMP: Automatic Test Generation for Asynchronous Digital Circuits. (Chappell, S.G.)
“BSTJ 53: 8. October 1974: LAMP: Automatic Test Generation For Asynchronous Digital Circuits. (Chappell, S.G.)” Metadata:
- Title: ➤ BSTJ 53: 8. October 1974: LAMP: Automatic Test Generation For Asynchronous Digital Circuits. (Chappell, S.G.)
- Language: English
“BSTJ 53: 8. October 1974: LAMP: Automatic Test Generation For Asynchronous Digital Circuits. (Chappell, S.G.)” Subjects and Themes:
- Subjects: ➤ circuit - input - equations - faults - sequence - atg - logical - gate - fault - sequential - input leads - undetected faults - test generation - bell system - sequence length - circuit input - circuit inputs - system technical - automatic test - generate tests
Edition Identifiers:
- Internet Archive ID: bstj53-8-1477
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 26.68 Mbs, the file-s for this book were downloaded 272 times, the file-s went public at Sat Jan 19 2013.
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