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Antireflecting Chromium Linewidth Standard%2c Srm 475%2c For Calibration Of Optical Microscope Linewidth Measuring Systems by Carol F. Vezzetti
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1Standard Reference Materials : Antireflecting-chromium Linewidth Standard, SRM 475, For Calibration Of Optical Microscope Linewidth Measuring Systems
By Vezzetti, Carol F.; Varner, Ruth N.; Potzick, James E.
“Standard Reference Materials : Antireflecting-chromium Linewidth Standard, SRM 475, For Calibration Of Optical Microscope Linewidth Measuring Systems” Metadata:
- Title: ➤ Standard Reference Materials : Antireflecting-chromium Linewidth Standard, SRM 475, For Calibration Of Optical Microscope Linewidth Measuring Systems
- Author: ➤ Vezzetti, Carol F.; Varner, Ruth N.; Potzick, James E.
- Language: English
Edition Identifiers:
- Internet Archive ID: standardreferen2601vezz_0
Downloads Information:
The book is available for download in "texts" format, the size of the file-s is: 127.54 Mbs, the file-s for this book were downloaded 150 times, the file-s went public at Fri May 30 2014.
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