Dopant imaging and profiling of wide bandgap semiconductor devices - Info and Reading Options
By Marco Buzzo
"Dopant imaging and profiling of wide bandgap semiconductor devices" was published by Hartung-Gorre in 2007 - Konstanz, it has 143 pages and the language of the book is English.
“Dopant imaging and profiling of wide bandgap semiconductor devices” Metadata:
- Title: ➤ Dopant imaging and profiling of wide bandgap semiconductor devices
- Author: Marco Buzzo
- Language: English
- Number of Pages: 143
- Publisher: Hartung-Gorre
- Publish Date: 2007
- Publish Location: Konstanz
“Dopant imaging and profiling of wide bandgap semiconductor devices” Subjects and Themes:
- Subjects: Wide gap semiconductors - Semiconductor doping - Silicon carbide
Edition Specifications:
- Pagination: xi, 143 p.
Edition Identifiers:
- The Open Library ID: OL31782474M - OL24085633W
- Library of Congress Control Number (LCCN): 2007427206
- ISBN-10: 3866281242
- All ISBNs: 3866281242
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