Distributed testing of a device-level interface specification for a metrology system - Info and Reading Options
By John Albert Horst
"Distributed testing of a device-level interface specification for a metrology system" was published by U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology in 2002 - Gaithersburg, MD, it has 19 pages and the language of the book is English.
“Distributed testing of a device-level interface specification for a metrology system” Metadata:
- Title: ➤ Distributed testing of a device-level interface specification for a metrology system
- Author: John Albert Horst
- Language: English
- Number of Pages: 19
- Publisher: ➤ U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- Publish Date: 2002
- Publish Location: Gaithersburg, MD
“Distributed testing of a device-level interface specification for a metrology system” Subjects and Themes:
- Subjects: Testing - Metrology - Coordinate measuring machines - Computer software
Edition Specifications:
- Format: Microform
- Pagination: 19 p.
Edition Identifiers:
- The Open Library ID: OL17607544M - OL18405479W
- Online Computer Library Center (OCLC) ID: 50263005
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