Digital Noise Monitoring of Defect Origin - Info and Reading Options
By Telman Aliev
"Digital Noise Monitoring of Defect Origin" was published by Springer in 2010 and the language of the book is English.
“Digital Noise Monitoring of Defect Origin” Metadata:
- Title: ➤ Digital Noise Monitoring of Defect Origin
- Author: Telman Aliev
- Language: English
- Publisher: Springer
- Publish Date: 2010
“Digital Noise Monitoring of Defect Origin” Subjects and Themes:
Edition Specifications:
- Weight: 0.454
- Pagination: xii, 224
Edition Identifiers:
- The Open Library ID: OL37119566M - OL27331078W
- ISBN-13: 9781441944108
- All ISBNs: 9781441944108
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