Digital circuit testing and testability - Info and Reading Options
By Parag K. Lala
"Digital circuit testing and testability" was published by Academic Press in 1997 - San Diego, it has 199 pages and the language of the book is English.
“Digital circuit testing and testability” Metadata:
- Title: ➤ Digital circuit testing and testability
- Author: Parag K. Lala
- Language: English
- Number of Pages: 199
- Publisher: Academic Press
- Publish Date: 1997
- Publish Location: San Diego
“Digital circuit testing and testability” Subjects and Themes:
- Subjects: ➤ Integrated circuits - Testing - Very large scale integration - Digital integrated circuits - Fault tolerance - Integrated circuits, very large scale integration
Edition Specifications:
- Pagination: xii, 199 p. :
Edition Identifiers:
- The Open Library ID: OL1002781M - OL2004908W
- Online Computer Library Center (OCLC) ID: 35317862
- Library of Congress Control Number (LCCN): 96042114
- ISBN-10: 0124343309
- All ISBNs: 0124343309
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