Defects in SiO₂ and related dielectrics - Info and Reading Options
science and technology
By David L. Griscom
"Defects in SiO₂ and related dielectrics" was published by Kluwer Academic Publishers in 2000 - Dordrecht, Netherlands, it has 624 pages and the language of the book is English.
“Defects in SiO₂ and related dielectrics” Metadata:
- Title: ➤ Defects in SiO₂ and related dielectrics
- Author: David L. Griscom
- Language: English
- Number of Pages: 624
- Publisher: Kluwer Academic Publishers
- Publish Date: 2000
- Publish Location: Dordrecht, Netherlands
“Defects in SiO₂ and related dielectrics” Subjects and Themes:
- Subjects: ➤ Crystals - Silica - Congresses - Defects - Electric properties - Crystals, defects
Edition Specifications:
- Pagination: viii, 624 p. :
Edition Identifiers:
- The Open Library ID: OL19142361M - OL19840618W
- Online Computer Library Center (OCLC) ID: 45102948
- Library of Congress Control Number (LCCN): 00048787
- ISBN-10: 0792366859
- All ISBNs: 0792366859
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