Defect recognition and image processing in III-V compounds, II - Info and Reading Options
proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987
By International Symposium on Defect Recognition and Image Processing in III-V Compounds (2nd 1987 Monterey, Calif.)
"Defect recognition and image processing in III-V compounds, II" was published by Elsevier in 1987 - Amsterdam, it has 320 pages and the language of the book is English.
“Defect recognition and image processing in III-V compounds, II” Metadata:
- Title: ➤ Defect recognition and image processing in III-V compounds, II
- Author: ➤ International Symposium on Defect Recognition and Image Processing in III-V Compounds (2nd 1987 Monterey, Calif.)
- Language: English
- Number of Pages: 320
- Publisher: Elsevier
- Publish Date: 1987
- Publish Location: Amsterdam
“Defect recognition and image processing in III-V compounds, II” Subjects and Themes:
- Subjects: ➤ Congresses - Defects - Gallium arsenide - Image processing - Semiconductors - Defects Congresses
Edition Specifications:
- Pagination: x, 320 p. :
Edition Identifiers:
- The Open Library ID: OL2397349M - OL4978497W
- Online Computer Library Center (OCLC) ID: 16754490
- Library of Congress Control Number (LCCN): 87027177
- ISBN-13: 9780444428929
- ISBN-10: 0444428925
- All ISBNs: 0444428925 - 9780444428929
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