Defect oriented testing for CMOS analog and digital circuits - Info and Reading Options
By Manoj Sachdev
"Defect oriented testing for CMOS analog and digital circuits" was published by Kluwer Academic in 1998 - Boston, it has 308 pages and the language of the book is English.
“Defect oriented testing for CMOS analog and digital circuits” Metadata:
- Title: ➤ Defect oriented testing for CMOS analog and digital circuits
- Author: Manoj Sachdev
- Language: English
- Number of Pages: 308
- Publisher: Kluwer Academic
- Publish Date: 1998
- Publish Location: Boston
“Defect oriented testing for CMOS analog and digital circuits” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Defects - Digital integrated circuits - Linear integrated circuits - Metal oxide semiconductors, Complementary - Testing - Testen - CMOS-Schaltung
Edition Specifications:
- Pagination: xiv, 308 p. :
Edition Identifiers:
- The Open Library ID: OL691883M - OL2724828W
- Library of Congress Control Number (LCCN): 97039048
- ISBN-10: 0792380835
- All ISBNs: 0792380835
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