Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics - Info and Reading Options
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By Damage to VUV, EUV, and X-Ray Optics (Conference) (4th 2013 Prague, Czech Republic)
"Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics" was published by SPIE in 2013 - Bellingham, Washington, the book is classified in Far ultraviolet radiation genre, it has 364 pages and the language of the book is English.
“Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics” Metadata:
- Title: ➤ Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics
- Author: ➤ Damage to VUV, EUV, and X-Ray Optics (Conference) (4th 2013 Prague, Czech Republic)
- Language: English
- Number of Pages: 364
- Is Family Friendly: Yes - No Mature Content
- Publisher: SPIE
- Publish Date: 2013
- Publish Location: Bellingham, Washington
- Genres: Far ultraviolet radiation
“Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics” Subjects and Themes:
- Subjects: ➤ X-Rays - Congresses - Biocompatible Materials - Radiation effects - Electron Probe Microanalysis - Methods - Ultraviolet Microscopy - Ultraviolet Rays
Edition Specifications:
- Pagination: 1 volume (various pagings)
Edition Identifiers:
- Google Books ID: 7napoAEACAAJ
- The Open Library ID: OL31162578M - OL23314290W
- Online Computer Library Center (OCLC) ID: 918994233
- Library of Congress Control Number (LCCN): 2014395157
- ISBN-13: 9780819495792
- ISBN-10: 0819495794
- All ISBNs: 0819495794 - 9780819495792
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"Damage to VUV, EUV, and X-Ray Optics IV; and EUV and X-ray Optics" Description:
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
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