Critical phenomena at surfaces and interfaces - Info and Reading Options
evanescent X-ray and neutron scattering
By Helmut Dosch
"Critical phenomena at surfaces and interfaces" was published by Springer-Verlag in 1992 - Berlin, it has 145 pages and the language of the book is English.
“Critical phenomena at surfaces and interfaces” Metadata:
- Title: ➤ Critical phenomena at surfaces and interfaces
- Author: Helmut Dosch
- Language: English
- Number of Pages: 145
- Publisher: Springer-Verlag
- Publish Date: 1992
- Publish Location: Berlin
“Critical phenomena at surfaces and interfaces” Subjects and Themes:
- Subjects: ➤ Critical phenomena (Physics) - Grazing incidence - Neutrons - Optical properties - Scattering - Surfaces (Physics) - X-rays - Crystallography - Physical and theoretical Chemistry - Physics - Physical organic chemistry - Spectrum analysis - Ultrafast Optics Optical Spectroscopy - Thin Films Surfaces and Interfaces - Characterization and Evaluation of Materials
Edition Specifications:
- Pagination: x, 145 p. :
Edition Identifiers:
- The Open Library ID: OL1556736M - OL4113961W
- Online Computer Library Center (OCLC) ID: 24630749
- Library of Congress Control Number (LCCN): 91037384
- ISBN-10: 0387545344 - 3540545344
- All ISBNs: 0387545344 - 3540545344
AI-generated Review of “Critical phenomena at surfaces and interfaces”:
"Critical phenomena at surfaces and interfaces" Description:
The Open Library:
This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
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