CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Info and Reading Options
Process-Aware SRAM Design and Test
By Andrei Pavlov and Manoj Sachdev
"CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies" was published by Springer in 2010, it has 194 pages and the language of the book is English.
“CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies” Metadata:
- Title: ➤ CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
- Authors: Andrei PavlovManoj Sachdev
- Language: English
- Number of Pages: 194
- Publisher: Springer
- Publish Date: 2010
“CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies” Subjects and Themes:
Edition Specifications:
- Weight: 0.332
Edition Identifiers:
- The Open Library ID: OL34371094M - OL25615555W
- ISBN-13: 9789048178551
- All ISBNs: 9789048178551
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