CMOS Gate-Stack Scaling Vol. 1155 - Info and Reading Options
Materials, Interfaces and Reliability Implications
By Alexander A. Demkov, Taylor, Bill, H. Rusty Harris, Jeffery W. Butterbaugh and Willy Rachmady
"CMOS Gate-Stack Scaling Vol. 1155" was published by University of Cambridge ESOL Examinations in 2014, it has 194 pages and the language of the book is English.
“CMOS Gate-Stack Scaling Vol. 1155” Metadata:
- Title: ➤ CMOS Gate-Stack Scaling Vol. 1155
- Authors: Alexander A. DemkovTaylor, BillH. Rusty HarrisJeffery W. ButterbaughWilly Rachmady
- Language: English
- Number of Pages: 194
- Publisher: ➤ University of Cambridge ESOL Examinations
- Publish Date: 2014
“CMOS Gate-Stack Scaling Vol. 1155” Subjects and Themes:
- Subjects: ➤ Metal oxide semiconductors, complementary - Silicides - Gate array circuits
Edition Identifiers:
- The Open Library ID: OL29206002M - OL21531412W
- ISBN-13: 9781107408326
- All ISBNs: 9781107408326
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