CMOS gate-stack scaling-- materials, interfaces and reliability implications - Info and Reading Options
symposium held April 14-16, 2009, San Francisco, california, U.S.A.
By Alexander A. Demkov
"CMOS gate-stack scaling-- materials, interfaces and reliability implications" was published by Materials Research Society in 2009 - Warrendale, Pa, it has 179 pages and the language of the book is English.
“CMOS gate-stack scaling-- materials, interfaces and reliability implications” Metadata:
- Title: ➤ CMOS gate-stack scaling-- materials, interfaces and reliability implications
- Author: Alexander A. Demkov
- Language: English
- Number of Pages: 179
- Publisher: Materials Research Society
- Publish Date: 2009
- Publish Location: Warrendale, Pa
“CMOS gate-stack scaling-- materials, interfaces and reliability implications” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Materials - Congresses - Silicides - Metal oxide semiconductors - Gate array circuits - Metal oxide semiconductors, complementary
Edition Specifications:
- Pagination: viii, 179 p. :
Edition Identifiers:
- The Open Library ID: OL25177911M - OL16471870W
- Online Computer Library Center (OCLC) ID: 505804375
- Library of Congress Control Number (LCCN): 2011294341
- ISBN-13: 9781605111285
- ISBN-10: 1605111287
- All ISBNs: 1605111287 - 9781605111285
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