Characterization of high Tc materials and devices by electron microscopy
By Stephen J. Pennycook
"Characterization of high Tc materials and devices by electron microscopy" was published by Cambridge University Press in 2000 - Cambridge, UK, it has 391 pages and the language of the book is English.
“Characterization of high Tc materials and devices by electron microscopy” Metadata:
- Title: ➤ Characterization of high Tc materials and devices by electron microscopy
- Author: Stephen J. Pennycook
- Language: English
- Number of Pages: 391
- Publisher: Cambridge University Press
- Publish Date: 2000
- Publish Location: Cambridge, UK
“Characterization of high Tc materials and devices by electron microscopy” Subjects and Themes:
- Subjects: ➤ Electron microscopy - Technique - High temperature superconductors - TECHNOLOGY & ENGINEERING - Superconductors & Superconductivity - Elektronenmikroskopie - Superconductors - Hochtemperatursupraleiter - Electron microscopes
Edition Specifications:
- Pagination: xii, 391 p. :
Edition Identifiers:
- The Open Library ID: OL22220562M - OL19259817W
- Online Computer Library Center (OCLC) ID: 40776918
- Library of Congress Control Number (LCCN): 99018754
- ISBN-10: 052155490X
- All ISBNs: 052155490X
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