Characterization of High Tc Materials and Devices by Electron Microscopy
By Stephen J. Pennycook
"Characterization of High Tc Materials and Devices by Electron Microscopy" was published by Cambridge University Press in 2000 - Cambridge New York, it has 391 pages and the language of the book is English.
“Characterization of High Tc Materials and Devices by Electron Microscopy” Metadata:
- Title: ➤ Characterization of High Tc Materials and Devices by Electron Microscopy
- Author: Stephen J. Pennycook
- Language: English
- Number of Pages: 391
- Publisher: Cambridge University Press
- Publish Date: 2000
- Publish Location: Cambridge New York
“Characterization of High Tc Materials and Devices by Electron Microscopy” Subjects and Themes:
- Subjects: ➤ Electron microscopy - Technique - High temperature superconductors - TECHNOLOGY & ENGINEERING - Superconductors & Superconductivity - Elektronenmikroskopie - Superconductors - Hochtemperatursupraleiter - Electron microscopes
Edition Identifiers:
- The Open Library ID: OL40479799M - OL19259817W
- ISBN-13: 9780511039669 - 9780511534829
- All ISBNs: 9780511039669 - 9780511534829
AI-generated Review of “Characterization of High Tc Materials and Devices by Electron Microscopy”:
"Characterization of High Tc Materials and Devices by Electron Microscopy" Description:
Open Data:
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications
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