Characterization of High Tc Materials and Devices by Electron Microscopy
By Stephen J. Pennycook
"Characterization of High Tc Materials and Devices by Electron Microscopy" is published by Cambridge University Press in 2005 and the language of the book is English.
“Characterization of High Tc Materials and Devices by Electron Microscopy” Metadata:
- Title: ➤ Characterization of High Tc Materials and Devices by Electron Microscopy
- Author: Stephen J. Pennycook
- Language: English
- Publisher: Cambridge University Press
- Publish Date: 2005
“Characterization of High Tc Materials and Devices by Electron Microscopy” Subjects and Themes:
- Subjects: ➤ Electron microscopy - Technique - High temperature superconductors - TECHNOLOGY & ENGINEERING - Superconductors & Superconductivity - Elektronenmikroskopie - Superconductors - Hochtemperatursupraleiter - Electron microscopes
Edition Identifiers:
- The Open Library ID: OL40479984M - OL19259817W
- ISBN-13: 9780511038150
- All ISBNs: 9780511038150
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