Characterization, Testing, Measurement, and Metrology - Info and Reading Options
By Chander Prakash, Sunpreet Singh and J. Paulo Davim
"Characterization, Testing, Measurement, and Metrology" was published by Taylor & Francis Group in 2020, it has 192 pages and the language of the book is English.
“Characterization, Testing, Measurement, and Metrology” Metadata:
- Title: ➤ Characterization, Testing, Measurement, and Metrology
- Authors: Chander PrakashSunpreet SinghJ. Paulo Davim
- Language: English
- Number of Pages: 192
- Publisher: Taylor & Francis Group
- Publish Date: 2020
“Characterization, Testing, Measurement, and Metrology” Subjects and Themes:
- Subjects: ➤ Materials - Testing - Matériaux - Essais - TECHNOLOGY / Manufacturing - TECHNOLOGY / Material Science
Edition Identifiers:
- The Open Library ID: OL33796374M - OL25249706W
- Online Computer Library Center (OCLC) ID: 1158509077
- Library of Congress Control Number (LCCN): 2020018335
- ISBN-13: 9781000193350
- All ISBNs: 9781000193350
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