Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
By David H. Krinsley, Kenneth Pye, Boggs, Sam, Jr. and N. Keith Tovey
"Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks" was published by Cambridge University Press in September 15, 2005, it has 203 pages and the language of the book is English.
“Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks” Metadata:
- Title: ➤ Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
- Authors: David H. KrinsleyKenneth PyeBoggs, Sam, Jr.N. Keith Tovey
- Language: English
- Number of Pages: 203
- Publisher: Cambridge University Press
- Publish Date: September 15, 2005
“Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks” Subjects and Themes:
- Subjects: ➤ Sedimentary rocks - Scanning electron microscopy - Sediments (Geology) - Rasterelektronenmikroskopie - Sediment - Analysis - Electron microscopes - Scanning electron microscopes - Sediments (geology)
Edition Specifications:
- Format: Paperback
- Weight: 13.4 ounces
- Dimensions: 9.6 x 7.4 x 0.6 inches
Edition Identifiers:
- The Open Library ID: OL7713646M - OL16939598W
- Online Computer Library Center (OCLC) ID: 60371138
- ISBN-13: 9780521019743
- ISBN-10: 0521019745
- All ISBNs: 0521019745 - 9780521019743
AI-generated Review of “Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks”:
Snippets and Summary:
During the past two to three decades, the scanning electron microscope (SEM) has become established as an essential tool in the study of sedimentary rocks, sediments, and soils.
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