Author: Manoj Sachdev
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Source: The Open Library
Authors called "Manoj Sachdev"
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Manoj Sachdev
Basic Info:
- Name: Manoj Sachdev
- Last Name: Sachdev
Books Results
Source: The Open Library
Manoj Sachdev Books
Books writen by author Manoj Sachdev from The Open Library
1Defect oriented testing for CMOS analog and digital circuits
By Manoj Sachdev

“Defect oriented testing for CMOS analog and digital circuits” Metadata:
- Title: ➤ Defect oriented testing for CMOS analog and digital circuits
- Author: Manoj Sachdev
- Language: English
Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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- Amazon: Audiable, Kindle and printed editions.
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2Thermal and Power Management of Integrated Circuits
By Arman Vassighi and Manoj Sachdev

“Thermal and Power Management of Integrated Circuits” Metadata:
- Title: ➤ Thermal and Power Management of Integrated Circuits
- Authors: Arman VassighiManoj Sachdev
- Language: English
Access and General Info:
- First Year Published: 2006
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find Thermal and Power Management of Integrated Circuits at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
3Defect-oriented testing for nano-metric CMOS VLSI circuits
By Manoj Sachdev and José Pineda de Gyvez

“Defect-oriented testing for nano-metric CMOS VLSI circuits” Metadata:
- Title: ➤ Defect-oriented testing for nano-metric CMOS VLSI circuits
- Authors: Manoj SachdevJosé Pineda de Gyvez
- Language: English
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find Defect-oriented testing for nano-metric CMOS VLSI circuits at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
4CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
By Andrei Pavlov and Manoj Sachdev
“CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies” Metadata:
- Title: ➤ CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
- Authors: Andrei PavlovManoj Sachdev
- Language: English
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
5Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
By Arman Vassighi and Manoj Sachdev

“Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)” Metadata:
- Title: ➤ Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)
- Authors: Arman VassighiManoj Sachdev
Access and General Info:
- First Year Published: 2006
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems) at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
6Thermal and Power Management of Integrated Circuits
By Arman Vassighi and Manoj Sachdev

“Thermal and Power Management of Integrated Circuits” Metadata:
- Title: ➤ Thermal and Power Management of Integrated Circuits
- Authors: Arman VassighiManoj Sachdev
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find Thermal and Power Management of Integrated Circuits at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
7Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edtion
By Manoj Sachdev and Jose Pineda de Gyvez
“Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edtion” Metadata:
- Title: ➤ Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edtion
- Author: ➤ Manoj Sachdev and Jose Pineda de Gyvez
- Language: English
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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82000 IEEE International Workshop on Defect Based Testing
By IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon and Quebec) IEEE VLSI Test Symposium (2000 : Montreal

“2000 IEEE International Workshop on Defect Based Testing” Metadata:
- Title: ➤ 2000 IEEE International Workshop on Defect Based Testing
- Authors: ➤ IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)Yashwant K. MalaiyaManoj SachdevSankaran M. MenonQuebec) IEEE VLSI Test Symposium (2000 : Montreal
- Language: English
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find 2000 IEEE International Workshop on Defect Based Testing at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.