Assessing fault model and test quality - Info and Reading Options
By Kenneth M. Butler
"Assessing fault model and test quality" was published by Kluwer Academic in 1992 - Boston, it has 132 pages and the language of the book is English.
“Assessing fault model and test quality” Metadata:
- Title: ➤ Assessing fault model and test quality
- Author: Kenneth M. Butler
- Language: English
- Number of Pages: 132
- Publisher: Kluwer Academic
- Publish Date: 1992
- Publish Location: Boston
“Assessing fault model and test quality” Subjects and Themes:
- Subjects: Digital integrated circuits - Fault tolerance - Integrated circuits - Testing - Fault-tolerant computing
Edition Specifications:
- Pagination: xviii, 132 p. :
Edition Identifiers:
- The Open Library ID: OL1552664M - OL4108981W
- Online Computer Library Center (OCLC) ID: 24379197
- Library of Congress Control Number (LCCN): 91032602
- ISBN-10: 0792392221
- All ISBNs: 0792392221
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