Arithmetic built-in self-test for embedded systems - Info and Reading Options
By Janusz Rajski
"Arithmetic built-in self-test for embedded systems" was published by Prentice Hall PTR in 1998 - Upper Saddle River, NJ, it has 268 pages and the language of the book is English.
“Arithmetic built-in self-test for embedded systems” Metadata:
- Title: ➤ Arithmetic built-in self-test for embedded systems
- Author: Janusz Rajski
- Language: English
- Number of Pages: 268
- Publisher: Prentice Hall PTR
- Publish Date: 1998
- Publish Location: Upper Saddle River, NJ
“Arithmetic built-in self-test for embedded systems” Subjects and Themes:
- Subjects: Embedded computer systems - Testing - Computer firmware
Edition Specifications:
- Pagination: xii, 268 p. :
Edition Identifiers:
- The Open Library ID: OL683634M - OL2702505W
- Online Computer Library Center (OCLC) ID: 37418268
- Library of Congress Control Number (LCCN): 97030395
- ISBN-13: 9780137564385
- ISBN-10: 0137564384
- All ISBNs: 0137564384 - 9780137564385
AI-generated Review of “Arithmetic built-in self-test for embedded systems”:
"Arithmetic built-in self-test for embedded systems" Description:
The Open Library:
Arithmetic Built-In Self-Test for Embedded Systems offers a thorough treatment of the important issues in software-based built-in self-test for systems with embedded processors. Fundamental concepts are illustrated with practical scenarios for test generation, test application, and test response compaction. Arithmetic Built-In Self-Test for Embedded Systems uses an approach to cutting-edge technology that will be of interest to hardware and embedded system designers, test and design engineers, and researchers working on IC/core testing. It is also appropriate for graduate-level design courses. An introductory chapter provides a comprehensive tutorial covering the most relevant DFT and BIST techniques.
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