Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems - Info and Reading Options
By James E. Potzick
"Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems" was published by United States Government Printing Office in 1997 and the language of the book is English.
“Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems” Metadata:
- Title: ➤ Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems
- Author: James E. Potzick
- Language: English
- Publisher: ➤ United States Government Printing Office
- Publish Date: 1997
“Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems” Subjects and Themes:
- Subjects: ➤ Standards - Calibration - Spectra - Masks - Microscopes - Measurement - Chromium - Integrated circuits
Edition Specifications:
- Pagination: 37
Edition Identifiers:
- The Open Library ID: OL50665109M - OL2897187W
- ISBN-13: 9780160545245
- All ISBNs: 9780160545245
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