Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems - Info and Reading Options
By Carol F. Vezzetti
“Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems” Metadata:
- Title: ➤ Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems
- Author: Carol F. Vezzetti
“Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems” Subjects and Themes:
- Subjects: ➤ Calibration - Chromium - Integrated circuits - Masks - Measurement - Microscopes - Spectra - Standards
Edition Identifiers:
- The Open Library ID: OL3862272W
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