Advances in Imaging and Electron Physics
By Peter W. Hawkes, Benjamin Kazan and Tom Mulvey
"Advances in Imaging and Electron Physics" was published by Elsevier Science & Technology Books in 2017 - San Diego, it has 248 pages and the language of the book is English.
“Advances in Imaging and Electron Physics” Metadata:
- Title: ➤ Advances in Imaging and Electron Physics
- Authors: Peter W. HawkesBenjamin KazanTom Mulvey
- Language: English
- Number of Pages: 248
- Publisher: ➤ Elsevier Science & Technology Books
- Publish Date: 2017
- Publish Location: San Diego
“Advances in Imaging and Electron Physics” Subjects and Themes:
- Subjects: ➤ Traitement d'images - Infographie - Fisica geral - Electron microscopes - Electron optics - Electrons - Image processing - Imaging systems - Optoelectronic devices - Electronics - Optical data processing - Nuclear physics - Electric meters - Électrons - Électronique - Electronic engineering - TECHNOLOGY & ENGINEERING - Mechanical - SCIENCE - Life Sciences - Botany
Edition Identifiers:
- The Open Library ID: OL34539125M - OL16959776W
- ISBN-13: 9780128121894
- All ISBNs: 9780128121894
AI-generated Review of “Advances in Imaging and Electron Physics”:
"Advances in Imaging and Electron Physics" Description:
Open Data:
Front Cover -- Advances in Imaging and Electron Physics -- Copyright -- Contents -- Contributors -- Preface -- Future Contributions -- 1 New Physical Principle for Interference of Light and Material Particles -- 1 Introduction -- 2 A Novel Theoretical Model -- 3 General Law of Interference -- 4 Peculiarities of the New General Law of Interference -- 5 Extended Sources and Interference from Gratings -- 6 Diffraction Effects and Uncertainty Principle -- 7 Conclusion -- Acknowledgment -- References -- 2 A Review of Scanning Electron Microscopy in Near Field Emission Mode -- 1 Introduction -- 1.1 Motivation and Terminology -- 2 Instrumentation -- 2.1 First Prototype -- 2.2 Alignment and Operation -- 2.3 NFESEM Imaging -- 2.4 Related Field Electron Emission Scanning Microscopy Techniques -- 2.4.1 Electron Spin Polarization -- 2.4.2 Electron Energy Loss Spectroscopy -- 3 Geometric In uence on Field Emission -- 3.1 The FE Process -- 3.2 Vertical Resolution -- 4 Primary Electron Beam Generation -- 4.1 Emitter Preparation -- 4.1.1 F-N Plot Analysis of Experimental Data -- 4.1.2 Surface Contamination and FE Current Stability -- 4.2 Field Emission from Non-Planar Surfaces -- 4.3 Lensless Focusing -- 4.4 Source Characterization -- 5 Topographic Imaging -- 6 Alternative Contrast Mechanisms -- 6.1 Magnetic -- 6.2 Chemical -- 6.3 Future Prospects -- 7 Conclusions -- Appendix A Detector Calibration -- Appendix B Comparison of reff vs. rphys -- Acknowledgments -- Figure Acknowledgments -- Disclaimer -- References -- 3 Nonscalar Mathematical Morphology -- 1 Introduction -- 2 Lattice-Based Mathematical Morphology -- 2.1 Morphology for Binary Images -- 2.2 Complete Lattice Framework -- Mappings -- Invariance -- 2.3 (Hyper)connected Filters -- 2.4 Inf-Semilattices -- 3 Frames -- 3.1 De nitions -- 3.2 Lattices and Group Invariance
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