Advanced Vlsi Design and Testability Issues - Info and Reading Options
By Suman Lata Tripathi, Sobhit Saxena and Sushanta Kumar Mohapatra

"Advanced Vlsi Design and Testability Issues" was published by Taylor & Francis Group in 2020 - Boca Raton, it has 378 pages and the language of the book is English.
“Advanced Vlsi Design and Testability Issues” Metadata:
- Title: ➤ Advanced Vlsi Design and Testability Issues
- Authors: Suman Lata TripathiSobhit SaxenaSushanta Kumar Mohapatra
- Language: English
- Number of Pages: 378
- Publisher: Taylor & Francis Group
- Publish Date: 2020
- Publish Location: Boca Raton
“Advanced Vlsi Design and Testability Issues” Subjects and Themes:
- Subjects: ➤ Integrated circuits - Very large scale integration - Design and construction - TECHNOLOGY - Electricity - Electronics - Circuits - General
Edition Specifications:
- Pagination: 360
Edition Identifiers:
- The Open Library ID: OL34674063M - OL21690268W
- ISBN-13: 9780367492823
- All ISBNs: 9780367492823
AI-generated Review of “Advanced Vlsi Design and Testability Issues”:
"Advanced Vlsi Design and Testability Issues" Description:
Open Data:
"This book facilitates the VLSI-interested peoples with not only the in-depth knowledge but also the broad aspects of it by explaining its applications in different fields, e.g., image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book"--
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